Cloud-based verification simulation technology to analyze the effect of semiconductor memory error on industrial equipment and vehicular control
نویسندگان
چکیده
Tokyo, Japan, 2 December 2011 – Hitachi, Ltd. (NYSE: HIT/TSE: 6501, hereafter, Hitachi) and Kobe University today announced the development of a cloud-based simulation technology for verifying effects caused by failure in semiconductor memory devices used in electronic control units (ECUs) installed in industrial equipments, automotive vehicles, and robots. This technology makes it possible to verify on a computer various effects caused by semiconductor-memory failure in cases such as embedded software and hardware like engines and motors. Moreover, applying it to development of ECUs makes it possible to verify the effect of the semiconductor-memory failure in a short time. Furthermore, the technology makes it possible to reduce the risks caused by the semiconductor-memory failure (such as an entire system going down). The developed simulation technology enables effective development of control units based on functional safety.
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